- 23. November 2021
- Posted by:
- Category: General
Detect reader failures and degradations in the field in seconds for a successfully implemented RFID system
Silicon Alps partner and Shareholder CISC Semiconductor, a leading company for design and testing of wireless communication systems, launches a portable RAIN Xplorer Reader Checker today, which enables easier and faster on-site performance checks of readers for higher reliability of the implemented RFID system.
With the launch of the RAIN Xplorer Reader Checker, CISC is offering a testing tool that fits in every engineer’s pocket and makes it more flexible for on-site performance checks, particularly in real environment such as hospitals, logistics, and retail applications. The device is easy to use by simply connecting the available up to four reader ports with the provided RF cables to check on pass/fail LED result indicator whether the reader transmit power and reader sensitivity fulfill the defined specification. Additional features like the Windows-based UI allow in- depth root cause analysis of failing devices, as well as setting new test requirements for the quality control and field use. The Reader Checker is supporting RAIN RFID Air Interface, ISO/IEC 18000-63, and GS1 EPC Gen2 standards for best interoperability.
CISC RAIN Xplorer Reader Checker
Discover RFID reader performance issues in seconds
Successful deployment of RFID systems relies on well-performing readers. It is crucial for the reliability of the implemented system that RFID readers read all tags in the field correctly and at the right level of speed. The CISC RAIN Xplorer Reader Checker is a portable tool that allows you to check whether a reader offers sufficient performance. The result is available within seconds after connecting the reader to the testing device.
Tested in collaborative development with “Race Result”
“We are the global innovation leader in sports timing. Our area of application pushes RFID technology to its limits. A reader that works absolutely flawlessly is essential for us”, says Nikias Klohr, CTO at Race Result. The Germany-based company was involved in the development and testing of the new device. “With the RAIN Xplorer Reader Checker, we can quickly and easily check whether the readers in our decoders are OK. Especially, because the device is so small and handy, we can test dozens of rental devices in our warehouse in a short time.”
“Developing such a test pocket tool together with a leading RAIN RFID solution provider as Race Result was a key driver for the Reader Checker”, says Josef Preishuber-Pflügl, CTO and Business Manager of RFID+NFC at CISC. “Offering a simple test solution to all the engineers in the field, lab or production is important for us to support the trust and overall acceptance of RFID solutions.”
Upcoming Webinar, November 30
RaceResult and CISC joint webinar on CISC RAIN Xplorer Reader Checker will be held on November 30 at 03:00 pm CET.
CTO and Head of R&D at RACE RESULT
About CISC Semiconductor
CISC Semiconductor is adding trust in a connected world by providing hardware and software solutions that enhance quality, security, privacy, performance, interoperability, and conformance in communication systems for markets like Automotive, Identification, Semiconductor, and Wireless Communication. CISC is a leading standardization consultant and an active member of the AIM Germany and North America, emi3, ETSI, IEC, ISO, NFC Forum, RAIN Alliance, and ARTEMIS Industry Association. CISC is headquartered in Klagenfurt, Austria, with subsidiaries in Graz and Mountain View (CA), USA.
WHITEPAPER: MEASUREMENT METHODS AND TEST STANDARDS FOR RFID AND NFC COMPONENTS
Offering test methods and test equipment for both product development and production requires the highest level of knowledge and competence in technology standards, product design, technical specifications, and application requirements. Despite increasing “plug and play solutions”, the integration and installation of contactless technology is a specialized field for experts. Efficient process optimizations must run without errors. This white paper provides market insights, practical examples and focuses on high speed test solutions.